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Edition cover

Digital circuit testing and testability

  • Parag K. Lala

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Genres

  • Integrated circuits
  • Testing
  • Very large scale integration
  • Digital integrated circuits
  • Fault tolerance
  • Integrated circuits, very large scale integration
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About the author

  • Parag K. Lala

    born 1948

    5.00

    1 ratings · 7 works

Editions

  • Edition cover

    Academic Press

    1997