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Defects in high-k gate dielectric stacks

  • NATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices (2005 Saint Petersburg, Russia)

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Genres

  • Congresses
  • Semiconductors
  • Dielectrics
  • Gate array circuits
  • Defects
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  • NATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices (2005 Saint Petersburg, Russia)

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    0 ratings · 1 works

Editions

  • Edition cover

    Springer

    2006